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Design of an intelligent vision inspection system for quality control in semiconductor industry

Mohd. Amin, Shamsudin (2005) Design of an intelligent vision inspection system for quality control in semiconductor industry. Project Report. Faculty of Electrical Engineering, Skudai, Johor. (Unpublished)

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Item Type:Monograph (Project Report)
Uncontrolled Keywords:Artificial intelligence, machine vision automated inspection semiconductor
Subjects:T Technology > TS Manufactures
Divisions:Electrical Engineering
ID Code:4282
Deposited By: Noor Aklima Harun
Deposited On:18 Feb 2008 08:35
Last Modified:01 Jun 2010 03:16

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