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A short review on Raman studies of metal chalcogenide semiconductor thin films

Ho, S. M. and Othman, M. H. D. and Adam, M. R. and Mohanraj, K. (2021) A short review on Raman studies of metal chalcogenide semiconductor thin films. Asian Journal of Chemistry, 33 (7). ISSN 0970-7077

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Official URL: http://dx.doi.org/10.14233/ajchem.2021.23112

Abstract

The productions of the thin metallic chalcogenide films are of particular interest for the wide range of fabrication of the solar cells, sensors, photodiode arrays, photoconductors. Raman spectroscopy is used to measure the scattering radiation of a matter. Basically, the spectroscopic methods can be defined as the study of the interaction of electromagnetic radiation with a matter. It can be based on the phenomenon of absorption, fluorescence, emission or scattering. The observation of peaks supported the formation of amorphous or crystalline nature of the samples. In this short review, the authors had gathered some informations about the Raman studies of recently synthesized metal chalcogenide semiconductor thin films.

Item Type:Article
Uncontrolled Keywords:metal chalcogenide, Raman studies, semiconductor
Subjects:T Technology > TP Chemical technology
Divisions:Chemical and Energy Engineering
ID Code:94761
Deposited By: Narimah Nawil
Deposited On:31 Mar 2022 15:14
Last Modified:31 Mar 2022 15:14

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