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Batool, Uzma and Shapiai, Mohd. Ibrahim and Fauzi, Hilman and Fong, Jia Xian (2020) Convolutional neural network for imbalanced data classification of silicon wafer defects. In: 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA), 28 February 2020 - 29 February 2020, Langkawi, Kedah, Malaysia.

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