Mohd. Napi, Muhammad Luqman and Mohamed Sultan, Suhana and Ismail, Razali and Ahmad, Mohd. Khairul (2019) Effect of post annealing treatment on electrical and structural properties of zinc oxide nanostructures. In: 2018 Nanotech Malaysia, 7 May 2018 through 9 May 2018, Universiti Teknologi Malaysia Kuala Lumpur, Malaysia.
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Official URL: http://dx.doi.org/10.1016/j.matpr.2018.12.065
Abstract
This paper work presents the effect of post annealing treatment on electrical and structural properties of nanostructured Zinc Oxide (ZnO) which was fabricated by hydrothermal process. I-V measurement shown the nanostructured ZnO exhibit Schottky conductive mechanism. The resistance of nanostructured ZnO was reduced as respected to the annealing temperature. XRD and EDX analysis confirmed the presence of ZnO element of Si substrate. Finally, FESEM analysis indicated a small nanoparticle growth on Si surface have 28.64 nm of average diameter size. These experiment results revealed, annealing treatment might be used to assist the formation of nanostructured ZnO on bare substrate.
Item Type: | Conference or Workshop Item (Paper) |
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Divisions: | Electrical Engineering |
ID Code: | 89657 |
Deposited By: | Yanti Mohd Shah |
Deposited On: | 22 Feb 2021 06:08 |
Last Modified: | 22 Feb 2021 06:08 |
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