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Effect of sm on yig: structural and dielectric properties evaluation

Ahmad, H. H. and Rejab, N. A. and Ahmad, Z. A. and Ain, M. F. and Othman, M. and Ali, W. F. F. W. (2019) Effect of sm on yig: structural and dielectric properties evaluation. In: International Conference on X-Rays and Related Techniques in Research and Industry 2018, ICXRI 2018, 18-19 Aug 2018, Grand Riverview Hotel Kota Bharu, Kelantan, Malaysia.

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Official URL: https://dx.doi.org/10.1063/1.5089411


This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5.

Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:dielectric properties, YIG
Subjects:T Technology > TJ Mechanical engineering and machinery
Divisions:Mechanical Engineering
ID Code:88770
Deposited By: Narimah Nawil
Deposited On:29 Dec 2020 12:19
Last Modified:29 Dec 2020 12:19

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