You, Kok Yeow and Sim, Man Seng (2018) Precision permittivity measurement for low-loss thin planar materials using large coaxial probe from 1 to 400 MHz. Journal of Manufacturing and Materials Processing, 2 (4). pp. 1-15. ISSN 2504-4494
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Abstract
This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three offset shorts. The reflection coefficient for the thin material is measured using a Keysight E5071C network analyzer from 0.3 MHz to 650 MHz and then converted to a relative dielectric constant and tangent loss via closed form capacitance model and lift-off calibration process. Measurement error of dielectric constant, Δεr is less than 2.5 % from 1 MHz to 400 MHz and the resolution of loss tangent, tan δ measurement is capable of achieving 3×10-3.
Item Type: | Article |
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Uncontrolled Keywords: | thin planar materials, low-loss materials |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Divisions: | Electrical Engineering |
ID Code: | 82316 |
Deposited By: | Siti Nor Hashidah Zakaria |
Deposited On: | 30 Sep 2019 09:00 |
Last Modified: | 25 Nov 2019 01:20 |
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