A novel plasmonic interferometry and the potential applications

Abstract

In this article, we have proposed the plasmonic interferometry concept and analytical details given. By using the conventional optical interferometry, which can be simply calculated by using the relationship between the electric field and electron mobility, the interference mobility visibility (fringe visibility) can be observed. The surface plasmons in the sensing arm of the Michelson interferometer is constructed by the stacked layers of the silicon-graphene-gold, allows to characterize the spatial resolution of light beams in terms of the electron mobility down to 100-nm scales, with measured coherence lengths as low as ∼100 nm for an incident wavelength of 1550 nm. We have demonstrated a compact plasmonic interferometer that can apply to the electron mean free paths measurement, from which the precise determination can be used for the high-resolution mean free path measurement and sensing applications. This system provides the practical simulation device parameters that can be fabricated and tested by the experimental platform.