Universiti Teknologi Malaysia Institutional Repository

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Wong, Yah Jin and Saad, Ismail and Ismail, Razali (2006) Characterization of strained silicon MOSFET using semiconductor TCAD tools. In: Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference, 29 Oct 2006-1 Dec 2006, Kuala Lumpur, Malaysia.

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