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Senejani, Mahdieh Nadi and Ghadiry, Mahdiar and Chia, Yee Ooi and Marsono, Muhammad Nadzir (2015) Built-in self test power and test time analysis in on-chip networks. Circuits, Systems, And Signal Processing, 34 (4). pp. 1057-1075. ISSN 0278-081X

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