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Sub-wavelength terahertz beam profiling of a THz source via an all-optical knife-edge technique

Sze, Ho Phing and Mazhorova, Anna V. and Shalaby, Mostafa and Peccianti, Marco and Clerici, Matteo and Pasquazi, Alessia and Öztürk, Yavuz and Ali, Jalil and Morandotti, Roberto (2015) Sub-wavelength terahertz beam profiling of a THz source via an all-optical knife-edge technique. Scientific Reports, 5 . ISSN 2045-2322

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Official URL: http://dx.doi.org/10.1038/srep08551

Abstract

Terahertz technologies recently emerged as outstanding candidates for a variety of applications in such sectors as security, biomedical, pharmaceutical, aero spatial, etc. Imaging the terahertz field, however, still remains a challenge, particularly when sub-wavelength resolutions are involved. Here we demonstrate an all-optical technique for the terahertz near-field imaging directly at the source plane. A thin layer (<100 nm-thickness) of photo carriers is induced on the surface of the terahertz generation crystal, which acts as an all-optical, virtual blade for terahertz near-field imaging via a knife-edge technique. Remarkably, and in spite of the fact that the proposed approach does not require any mechanical probe, such as tips or apertures, we are able to demonstrate the imaging of a terahertz source with deeply sub-wavelength features (<30 µm) directly in its emission plane.

Item Type:Article
Uncontrolled Keywords:terahertz technologies, optical technique
Subjects:Q Science > QC Physics
Divisions:Science
ID Code:56206
Deposited By: Muhamad Idham Sulong
Deposited On:20 Nov 2016 12:50
Last Modified:17 Sep 2017 09:29

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