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Simple calibration and dielectric measurement technique for thin material using coaxial probe

Kok, Yeow You and Yi, Lung Then (2015) Simple calibration and dielectric measurement technique for thin material using coaxial probe. IEEE Sensors Journal, 15 (10). pp. 5393-5397. ISSN 1530-437X

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Official URL: http://dx.doi.org/10.1109/JSEN.2015.2427873

Abstract

This paper focuses on the nondestructive dielectric measurement for thin dielectric material using open-ended coaxial probe. The probe calibration procedure requires only a measurement of a half-space air and three open standard kits. The measured reflection coefficient for thin sample, which is backed by metal plate, is taken with a vector network analyzer up to 7 GHz and the reflection coefficient is converted to relative dielectric constant and tangent loss via closed form capacitance model and simple calibration process.

Item Type:Article
Uncontrolled Keywords:calibration, coaxial probe
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK6570 Mobile Communication System
Divisions:Electrical Engineering
ID Code:55980
Deposited By: Muhamad Idham Sulong
Deposited On:15 Nov 2016 14:39
Last Modified:12 Sep 2017 16:25

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