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Saad, Ismail and Chan, Bun Seng and Hamzah, Mohd. Zuhir and Ismail, Razali and Mohamad, Khairul Anuar and Ghosh, Bablu and Ismail, Razali and Hashim, Uda (2014) Breakdown voltage reduction analysis with adopting dual channel vertical strained SiGe impact ionization MOSFET (VESIMOS). International Journal of Simulation: Systems, Science and Technology, 15 (2). pp. 40-45. ISSN 1473-8031

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