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Thermal stress effect in diode end-pumped Nd:YVO4 bar laser

Bidin, Noriah and Krishnan, Ganesan and Khamsan, Nur Ezaan and Zainal, Roslinda and Bakhtiar, Hazri (2012) Thermal stress effect in diode end-pumped Nd:YVO4 bar laser. In: AIP Conference Proceedings. American Institute of Physics, Zurich, Switzerland, pp. 191-194. ISBN 978-073541056-5

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Official URL: http://dx.doi.org/10.1063/1.4732491


The thermal stress effect on various doping levels of yttrium vanadate crystal Nd:YVO4 is investigated. Diode end-pumped source was used to obtain the input-output characteristics of the vanadate crystal. The laser performance of the low doping crystal is poor since the optical conversion efficiency is small and high threshold pump power. However the low Dopant crystal is not associated with thermal stress thus no thermal damage. Differently with higher concentration of Nd ions crystal, the laser performance is relatively high but it is accompanied with thermal damage which comprised of microcrack, microfracture and contamination. The high absorption on the doping ions with additional external impurities causes extra heat generation which leads to thermal fracture.

Item Type:Book Section
Additional Information:Indexed by Scopus
Uncontrolled Keywords:absorption, Nd:YVO4 crystal, thermal damage, thermal fracture, thermal stress, threshold
Subjects:Q Science
ID Code:36053
Deposited By: Fazli Masari
Deposited On:02 Dec 2013 11:57
Last Modified:02 Feb 2017 13:19

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