404 File not FoundCould not find the file: The file you are trying to access may be related to this item: Wahab, Yussof and Woon, Y. W. and Deraman, Karim (2010) Excess silicon concentration dependence of the structural and optical properties of silicon nanocrystals embedded in silicon oxide matrix. International Journal of Nanomanufacturing, 5 (12). 79 - 87. ISSN 1746-9392 If you reached this page by following a link within the repository, please contact the Universiti Teknologi Malaysia Institutional Repository administration. Otherwise, please check that you have typed the URL in correctly, or contact the person or site that supplied you with this URL. |