Effect of surface finish metallurgy on intermetallic compuands during soldering with tin-silver-copper solders

Abstract

Solder joint reliability is dependent on both thickness and morphology of the intermetallics that form and grow at the solder joint interface during soldering and subsequent thermal ageing and examining the morphology of these intermetallics is of great importance. The focus of this paper is to present experimental results of a comprehensive study of the interfacial reactions during soldering of Sn-Ag-Cu lead-free solders on copper (Cu), immersion silver (ImAg), electroless nickel/ immersion gold (ENIG) and electroless nickel/ electroless palladium/ immersion gold (ENEPIG) surface finishes. Using scanning electron microscopy detailed a study of the 3-D morphology and grain size of the intermetallics was conducted. The results showed that when soldering on ENIG and ENEPIG finishes several morphologies of intermetallics with different grain sizes form at the solder joint interface compared to a single intermetallic morphology that forms when soldering on copper and immersion silver. An attempt was made to discuss the effect of several factors that may have an influence on the type of morphology the intermetallics may grow into. The results obtained in the present investigation also revealed that the technique of removing the solder by deep etching to examine the morphology of intermetallics is a convenient and efficient method to investigate the intermetallics formed at the solder joints.