A'ain, Abu Khari and Lim, C. T. and Kok, Hong Ng and Sheng, Kwang Ng and Liew, Eng Yew (2004) A study on signature analyzer for design for test (DFT). In: Proceedings 2004 IEEE International Conference on Semiconductor Electronics. IEEE, USA, pp. 138-142. ISBN 0-7803-8658-2
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Abstract
This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.
| Item Type: | Book Section |
|---|---|
| Additional Information: | ISBN: 0-7803-8658-2 IEEE International Conference on Semiconductor Electronics, 07-09 Dec 2004, Kuala Lumpur, MALAYSIA |
| Uncontrolled Keywords: | LFSR, PRBS, BIST, ATPG |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 1888 |
| Deposited By: | Dr Zaharuddin Mohamed |
| Deposited On: | 16 Mar 2007 02:27 |
| Last Modified: | 03 Mar 2011 06:47 |
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