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Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage

Ibrahim, Muhammad Faisal (2009) Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.

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Item Type:Thesis (Masters)
Additional Information:Supervisor : Prof. Dr. Abu Khari A'ain; Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:18227
Deposited By: Kamariah Mohamed Jong
Last Modified:18 Nov 2011 04:32

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