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Optical properties of thin hexagonal boron nitride layers

Soltani, Ali and Bakhtiar, Hazri and Thevenin, Philippe and Bath, Armand (2003) Optical properties of thin hexagonal boron nitride layers. Jurnal Fizik UTM, 9 (1). pp. 21-29. ISSN 0128-8644

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Thin films of hexagonal boron nitride have been deposited at low temperature in a microwave plasma enhanced chemical vapor deposition reactor. They have been characterized by Infrared (FTIR) and micro-Raman spectroscopy (SMR). The films are optically anisotropic, and the IR measurements can be properly modelized when using an uniaxial model for the layers. This description is valid at the macroscopic scale, but gives only an averaged response of the polycrystalline nature of the films. Actually, they are constituted at the atomic scale by a collection of nanocrystallites with a preferred orientation around the normal of the layer. The size of the crystallites can be evaluated by micro-Raman measurements, when taking into account a confinement model. Some thermal annealing have been performed.

Item Type:Article
Uncontrolled Keywords:nitrides, h-BN thin film, FTIR, micro-Raman, orientation, crystal size
Subjects:Q Science > QC Physics
ID Code:11003
Deposited By: Zalinda Shuratman
Deposited On:19 Nov 2010 02:31
Last Modified:19 Nov 2010 02:31

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