Mohammad Din, S. and Leow, P. L. and Hor, X. F. and Pusppanathan, J. and Zulkifli, N. A. and Abdul Rahim, R. (2019) Electrical potential study of single and segmented excitation for planar electrical capacitance tomography. In: 9th IEEE International Conference on System Engineering and Technology, ICSET 2019, 7 Okt 2019, Shah Alam, Selangor, Malaysia.
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Official URL: http://dx.doi.org/10.1109/ICSEngT.2019.8906414
Abstract
Electrical Capacitance Tomography (ECT) is an imaging modality that can produce image reconstruction for the closed region, by measuring the permittivity value in the inspected area. This paper investigates numerically the characteristics of planar ECT configuration with single and segmented excitation. Simulations analysis were carried out using 8-electrode ECT system. The copper electrodes are fabricated at the bottom of the chamber. The planar model has a risk of detection where the sensitivity of the electrical field becomes weaker for areas away from the electrode, and for planar configuration it involves the upper area of the chamber. Simulation study is conducted by comparing different type excitation; single and segmented excitation (Protocols 1 and 2). Three points of voltage values in the upper area of the chamber are extracted for electric field strength study. Comparison in terms of image of excitation and also the difference in voltage value is taken into account, and from the analysis carried out, Protocol 2 provides a better electrical potential value than Protocol 1 with an average difference of 0.63V. Observation also found that if the electrode is excite near the wall chamber, there is a higher concentration of electrical potential in the chamber edge area.
Item Type: | Conference or Workshop Item (Paper) |
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Uncontrolled Keywords: | electrical capacitance tomography, electrical potential, planar tomography |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Divisions: | Electrical Engineering |
ID Code: | 92779 |
Deposited By: | Narimah Nawil |
Deposited On: | 28 Oct 2021 10:10 |
Last Modified: | 28 Oct 2021 10:10 |
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