Ahmad, H. H. and Rejab, N. A. and Ahmad, Z. A. and Ain, M. F. and Othman, M. and Ali, W. F. F. W. (2019) Effect of sm on yig: structural and dielectric properties evaluation. In: International Conference on X-Rays and Related Techniques in Research and Industry 2018, ICXRI 2018, 18-19 Aug 2018, Grand Riverview Hotel Kota Bharu, Kelantan, Malaysia.
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Official URL: https://dx.doi.org/10.1063/1.5089411
Abstract
This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | dielectric properties, YIG |
| Subjects: | T Technology > TJ Mechanical engineering and machinery |
| Divisions: | Mechanical Engineering |
| ID Code: | 88770 |
| Deposited By: | Narimah Nawil |
| Deposited On: | 29 Dec 2020 04:19 |
| Last Modified: | 29 Dec 2020 04:19 |
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