Universiti Teknologi Malaysia Institutional Repository

Electron driven mobility model by light on the stacked metal–dielectric interfaces

Pornsuwancharoen, N. and Youplao, P. and Amiri, I. S. and Ali, J. and Yupapin, P. (2017) Electron driven mobility model by light on the stacked metal–dielectric interfaces. Microwave and Optical Technology Letters, 59 (7). pp. 1704-1709. ISSN 0895-2477

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Official URL: http://dx.doi.org/10.1002/mop.30612

Abstract

An electron mobility enhancement is the very important phenomenon of an electron in the electronic device, where the high electronic device performance has the good electron mobility, which is obtained by the overall electron drift velocity in the electronic material driven potential difference. The increase in electron mobility by the injected high group velocity pulse is proposed in this article. By using light pulse input into the nonlinear microring resonator, light pulse group velocity can be tuned and increased, from which the required output group velocity can be obtained, which can be used to drive electron within the plasmonic waveguide, where eventually, the relative electron mobility can be obtained, the increasing in the electron mobility after adding up by the driven optical fields can be connected to the external electronic devices and circuits, which can be useful for many applications.

Item Type:Article
Uncontrolled Keywords:microring resonator, plasmonic waveguide, stacked waveguides
Subjects:Q Science > Q Science (General)
Divisions:Science
ID Code:80659
Deposited By: Narimah Nawil
Deposited On:27 Jun 2019 06:12
Last Modified:27 Jun 2019 06:12

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