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X-ray diffraction study of evaporated cadmium telluride thin films

Ismail, Bakar and Deraman, Karim and Woon, H. Y. (2009) X-ray diffraction study of evaporated cadmium telluride thin films. Jurnal Fizik UTM, 4 . pp. 26-34. ISSN 0128-8644

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Abstract

X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was increased finer crystallite size was obtained, while at the same time the micro-strain decreased. The decrease in crystallite size at higher deposition rate can be interpreted according to the increased velocity and intensity of the vapour atoms during rapid film formation. The crystallite size increased as the substrate temperature was increased up to 200 oC, above which the crystallite size decreased again. As the thickness was increased the micro-strain decreased, while the crystallite size increased with thickness

Item Type:Article
Uncontrolled Keywords:X-ray diffraction, CdTe thin films
Subjects:Q Science > QC Physics
Divisions:Science
ID Code:744
Deposited By: Pn Norazana Ibrahim
Deposited On:22 Feb 2007 05:45
Last Modified:21 Nov 2013 04:24

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