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Numerical studies of ion beam in NX2 plasma focus for different applied voltage

Nawi, N. D. and Ong, S. T. and Ali, J. and Chaudhary, K. and Bahadoran, M. and Daud, S. (2016) Numerical studies of ion beam in NX2 plasma focus for different applied voltage. Jurnal Teknologi, 78 (3-2). pp. 133-137. ISSN 0127-9696

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Abstract

Plasma focus device gives simultaneous interaction between magnetic and electric field which results in exhibiting multi-radiation properties. Ion beam radiates from the system is significant for experimenting target material of interest in plasma focus research. Lee code model is used to simulate the numerical experiments on NX2-plasma focus device system using different applied voltage in the range 10 to 14 kV. The system is operating in Neon filled at an optimum pressure depending on the applied voltage used in the experiment. Results obtained are analysed and fitted with the experimental results for system validation. Good fitting on the numerical with the experimental results is obtained by incorporating mass shedding effects and current shedding factor. The range of current density obtained is in the range 1.6 × 108 to 7.3×109 Am-2whilst the maximum ion beam energy is estimated to be 156 J.

Item Type:Article
Additional Information:Also available in SCOPUS
Uncontrolled Keywords:applied voltage, focusing phase, plasma focus
Subjects:R Medicine > RM Therapeutics. Pharmacology
ID Code:70081
Deposited By: Narimah Nawil
Deposited On:22 Nov 2017 00:45
Last Modified:22 Nov 2017 00:45

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