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Finite element analysis of single cell stiffness measurements using PZT- integrated buckling nanoneedles

Alsadat Rad, Maryam and Tijjani, Auwal Shehu and Ahmad, Mohd Ridzuan and Muhammad Auwal, Shehu (2017) Finite element analysis of single cell stiffness measurements using PZT- integrated buckling nanoneedles. Sensors, 17 (1). p. 14. ISSN 1424-8220

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Official URL: http://dx.doi.org/10.3390/s17010014

Abstract

This paper proposes a new technique for real-time single cell stiffness measurement using lead zirconate titanate (PZT)-integrated buckling nanoneedles. The PZT and the buckling part of the nanoneedle have been modelled and validated using the ABAQUS software. The two parts are integrated together to function as a single unit. After calibration, the stiffness, Young’s modulus, Poisson’s ratio and sensitivity of the PZT-integrated buckling nanoneedle have been determined to be 0.7100 N·m−1, 123.4700 GPa, 0.3000 and 0.0693 V·m·N−1, respectively. Three Saccharomyces cerevisiae cells have been modelled and validated based on compression tests. The average global stiffness and Young’s modulus of the cells are determined to be 10.8867 ± 0.0094 N·m−1 and 110.7033 ± 0.0081 MPa, respectively. The nanoneedle and the cell have been assembled to measure the local stiffness of the single Saccharomyces cerevisiae cells The local stiffness, Young’s modulus and PZT output voltage of the three different size Saccharomyces cerevisiae have been determined at different environmental conditions. We investigated that, at low temperature the stiffness value is low to adapt to the change in the environmental condition. As a result, Saccharomyces cerevisiae becomes vulnerable to viral and bacterial attacks. Therefore, the proposed technique will serve as a quick and accurate process to diagnose diseases at early stage in a cell for effective treatment.

Item Type:Article
Additional Information:RADIS System Ref No:PB/2016/08300
Uncontrolled Keywords:global stiffness, local stiffness
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Advanced Informatics School
ID Code:66475
Deposited By: Fazli Masari
Deposited On:03 Oct 2017 13:10
Last Modified:03 Oct 2017 13:10

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