Mohd. Zain, Rasif and Maneuski, Dima and O'Shea, Val and Bates, Richard Laurence and Blue, A. and Cunnigham, L. and Stehl, C. and Berderman, E. and Abdul Rahim, Ruzairi (2014) Leakage current measurements of a pixelated polycrystalline CVD diamond detector (vol 8, C01056, 2013). Journal of Instrumentation, 9 . ISSN 1748-0221
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Official URL: http://dx.doi.org/10.1088/1748-0221/8/01/C01056
Abstract
Diamond has several desirable features when used as a material for radiation detection. With the invention of synthetic growth techniques, it has become feasible to look at developing diamond radiation detectors with reasonable surface areas. Polycrystalline diamond has been grown using a chemical vapour deposition (CVD) technique by the University of Augsburg and detector structures fabricated at the James Watt Nanofabrication Centre (JWNC) in the University of Glasgow in order to produce pixelated detector arrays. The anode and cathode contacts are realised by depositing gold to produce ohmic contacts. Measurements of I-V characteristics were performed to study the material uniformity. The bias voltage is stepped from -1000V to 1000V to investigate the variation of leakage current from pixel to pixel. Bulk leakage current is measured to be less than 1nA
| Item Type: | Article |
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| Uncontrolled Keywords: | chemical vapour deposition, detector materials, diamond radiation detectors |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 53307 |
| Deposited By: | Siti Nor Hashidah Zakaria |
| Deposited On: | 01 Feb 2016 03:53 |
| Last Modified: | 25 Jul 2018 07:55 |
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