Sakrani, Samsudi and Belal Adam, Abdallah and Wahab, Yussof (2002) Investigation on the properties of SnxSb10Se90-x chalcogenide semiconductor. Malaysian solid state science and technology society, 10 (1 & 2). pp. 60-67. ISSN 0128-7389
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Abstract
Studies on tin-antimony-selenium (TAS) system of SnxSb10Se90-x (x= 0, 5, 10, 12.5, 15, 20 and 30) have been carried out using XRD, XGT and DTA and density measurement, so as to elucidate the structural states and thermal properties. XRD analysis for x= 0, 5, 10 and 12.5 gave an indicative amorphous phase, while that of the samples with x= 15, 20 and 30 maintain the crystalline structures. These were further confirmed by XGT results, which measured the weight percentages and elemental mapping of the samples. It was also observed that x plays important roles in determining the thermal quantities and density of the samples.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | chalcogenide semiconductor; thermal properties |
| Subjects: | Q Science > QC Physics |
| Divisions: | Science |
| ID Code: | 3530 |
| Deposited By: | Samsudi Sakrani |
| Deposited On: | 19 Jun 2007 01:43 |
| Last Modified: | 01 Jun 2010 03:10 |
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