Algeelani, Nasir Ahmed and Mohamed Piah, Mohamed Afendi (2012) Characterization of leakage current on high voltage glass insulators using wavelet transform technique. In: ICIAS 2012 - 2012 4th International Conference on Intelligent and Advanced Systems: A Conference of World Engineering, Science and Technology Congress (ESTCON) - Conference Proceedings. IEEE, New York, USA, pp. 882-885. ISBN 978-145771967-7
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Official URL: http://dx.doi.org/10.1109/ICIAS.2012.6306139
Abstract
The measurement and analysis of leakage current (LC) for condition-based monitoring and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Leakage current plays an important role in the detection of insulator's condition. This paper proposes a method for reducing the noise included in the current signal. The tests were carried out on cleaned and polluted glass insulators by using surface tracking and erosion test procedure of IEC 60587. Wavelet analysis method is used to compress the leakage current data. Experimental results shows that the actual signals of leakage current are related to the levels of insulator contamination.
| Item Type: | Book Section |
|---|---|
| Additional Information: | Indexed by Scopus |
| Uncontrolled Keywords: | condition-based monitoring, current signal, erosion test, glass insulators, high voltage, insulator contamination |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 34559 |
| Deposited By: | INVALID USER |
| Deposited On: | 09 Oct 2013 06:44 |
| Last Modified: | 02 Feb 2017 04:59 |
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