Universiti Teknologi Malaysia Institutional Repository

Modified pattern generator of built-in self test for sequential circuits with reduced test time

Muhamad Amin, Muhamad Ridzuan Radin (2011) Modified pattern generator of built-in self test for sequential circuits with reduced test time. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.

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Item Type:Thesis (Masters)
Additional Information:Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2011; Supervisor : Prof. Dr. Abu Khari A'ain
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:26858
Deposited By: Kamariah Mohamed Jong
Deposited On:07 Aug 2012 02:00
Last Modified:07 Aug 2012 02:00

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