Muhamad Amin, Muhamad Ridzuan Radin (2011) Modified pattern generator of built-in self test for sequential circuits with reduced test time. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
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| Item Type: | Thesis (Masters) |
|---|---|
| Additional Information: | Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2011; Supervisor : Prof. Dr. Abu Khari A'ain |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 26858 |
| Deposited By: | Kamariah Mohamed Jong |
| Deposited On: | 07 Aug 2012 02:00 |
| Last Modified: | 10 Jul 2017 07:19 |
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