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Comprehensive study on random access memory testing : from test pattern generation algorithm to MBIST implementation

Yap, Suk Han (2010) Comprehensive study on random access memory testing : from test pattern generation algorithm to MBIST implementation. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.

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Item Type:Thesis (Masters)
Additional Information:Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Mikroelektronik)) - Universiti Teknologi Malaysia, 2010; Supervisor : Dr. Ooi Chia Yee
Subjects:Unspecified
Divisions:Electrical Engineering
ID Code:26454
Deposited By: Kamariah Mohamed Jong
Deposited On:16 Jul 2012 04:19
Last Modified:06 Jul 2017 00:01

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