Yap, Suk Han (2010) Comprehensive study on random access memory testing : from test pattern generation algorithm to MBIST implementation. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
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| Item Type: | Thesis (Masters) |
|---|---|
| Additional Information: | Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Mikroelektronik)) - Universiti Teknologi Malaysia, 2010; Supervisor : Dr. Ooi Chia Yee |
| Subjects: | Unspecified |
| Divisions: | Electrical Engineering |
| ID Code: | 26454 |
| Deposited By: | Kamariah Mohamed Jong |
| Deposited On: | 16 Jul 2012 04:19 |
| Last Modified: | 16 Jul 2012 04:19 |
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