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Characterization analysis of nano scale vertical double gate MOSFET (VDGM) using TCAD

Ismail, Razali and Saad, Ismail (2007) Characterization analysis of nano scale vertical double gate MOSFET (VDGM) using TCAD. In: 4th International Conference on Materials for Advanced Technologies (ICMAT 2007), 1st – 6th July 2007, Singapore.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:24427
Deposited By: Ramli Haron
Deposited On:18 Apr 2012 05:41
Last Modified:18 Apr 2012 05:41

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