Ismail, Razali and Saad, Ismail (2007) Characterization analysis of nano scale vertical double gate MOSFET (VDGM) using TCAD. In: 4th International Conference on Materials for Advanced Technologies (ICMAT 2007), 1st – 6th July 2007, Singapore.
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|Item Type:||Conference or Workshop Item (Paper)|
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering|
|Deposited By:||INVALID USER|
|Deposited On:||18 Apr 2012 05:41|
|Last Modified:||18 Apr 2012 05:41|
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