Universiti Teknologi Malaysia Institutional Repository

Nanofork and line-patterned substrate for measuring single cells adhesion force inside ESEM

Ahmad, Mohd. Ridzuan and Fukuda, T. and Nakajima, M. and Kojima, M. and Kojima, S. (2010) Nanofork and line-patterned substrate for measuring single cells adhesion force inside ESEM. In: Proceeding of the 10th IEEE Conference on Nanotechnology (IEEE NANO 2010), 17-20 August 2010, Seoul Korea.

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Official URL: http://dx.doi.org/10.1109/NANO.2010.5697764

Abstract

In this paper, single cell adhesion force was measured using a nanofork. The nanofork was used to pick-up a single cell on a line-patterned substrate inside ESEM. The line-patterned substrate was used to provide small gaps between the single cells and the substrate. Therefore, the nanofork could be inserted through these gaps in order to successfully pick-up a single cell. Adhesion force was measured during the cell pick-up process from the deflection of the cantilever beam. The nanofork was fabricated using focused ion beam (FIB) etching process while the line-patterned substrate was fabricated using nanoimprinting technology. As to investigate the effect of contact area on the strength of the adhesion force, two sizes of gap distance of line-patterned substrate were used, i.e. 1 µm and 2 µm. Results showed that cells attached on the 1 µm gap line-patterned substrate required more force to be released as compared to the cells attached on the 2 µm gap line-patterned substrate.

Item Type:Conference or Workshop Item (Paper)
Subjects:Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions:Computer Science and Information System (Formerly known)
ID Code:24117
Deposited By: Liza Porijo
Deposited On:22 Jun 2012 01:39
Last Modified:22 Jun 2012 01:41

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