Ahmad, Mohd. Ridzuan and Fukuda, T. and Nakajima, M. and Kojima, M. and Kojima, S. (2010) Nanofork and line-patterned substrate for measuring single cells adhesion force inside ESEM. In: Proceeding of the 10th IEEE Conference on Nanotechnology (IEEE NANO 2010), 17-20 August 2010, Seoul Korea.
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Official URL: http://dx.doi.org/10.1109/NANO.2010.5697764
In this paper, single cell adhesion force was measured using a nanofork. The nanofork was used to pick-up a single cell on a line-patterned substrate inside ESEM. The line-patterned substrate was used to provide small gaps between the single cells and the substrate. Therefore, the nanofork could be inserted through these gaps in order to successfully pick-up a single cell. Adhesion force was measured during the cell pick-up process from the deflection of the cantilever beam. The nanofork was fabricated using focused ion beam (FIB) etching process while the line-patterned substrate was fabricated using nanoimprinting technology. As to investigate the effect of contact area on the strength of the adhesion force, two sizes of gap distance of line-patterned substrate were used, i.e. 1 µm and 2 µm. Results showed that cells attached on the 1 µm gap line-patterned substrate required more force to be released as compared to the cells attached on the 2 µm gap line-patterned substrate.
|Item Type:||Conference or Workshop Item (Paper)|
|Subjects:||Q Science > QA Mathematics > QA75 Electronic computers. Computer science|
|Divisions:||Computer Science and Information System (Formerly known)|
|Deposited By:||Liza Porijo|
|Deposited On:||22 Jun 2012 01:39|
|Last Modified:||22 Jun 2012 01:41|
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