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Evaporated SnS semiconducting thin films

Deraman, K. and Sakrani, S. and Ismail, B. (1994) Evaporated SnS semiconducting thin films. Proceeding of Second International Conference on Thin Film Physics and Application, 2364 . pp. 357-361.

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Official URL: http://dx.doi.org/10.1117/12.190780


Evaporated tin sulphide thin films (SnS) have been prepared onto glass substrates maintained at fixed temperatures in the range 50-300 degree(s)C and controlled film thicknesses. The films are nonstoichiometric, containing both SnS and its higher derivative compounds with different compositions. X-ray results showed that SnS was initially formed at 100 degree(s)C, accumulating and eventually became a stable compound at a substrate temperature, Ts of 300 degree(s)C. Observation on SEM micrographs revealed the existence of nonoriented film structures at low Ts and compacted crystalline structures at Ts equals 300 degree(s)C with the associated change in grain sizes from 0.1 to 1.2 micrometers . Film conductivity increased from 0.62 to 2.54 Sm-1 with increasing substrate temperature. The low temperature measurements showed that the films underwent hopping and free band conduction at temperatures lower and higher than 220 K, respectively. A further investigation on the film's transmittance spectrum shows the dependent of optical bandgaps (1.26-1.07 eV) with substrate temperatures; these were attributed to the changes in the film's compositions.

Item Type:Article
Uncontrolled Keywords:tin sulphide, thin film
Subjects:T Technology > T Technology (General)
Q Science > QC Physics
ID Code:2381
Deposited By: Associate Professor Dr Karim Deraman
Deposited On:04 Nov 2008 03:54
Last Modified:05 Apr 2017 11:06

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