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AFM, HR-XRD and PL characterization of stacked structures In 0.5Ga0.5As/GaAs quantum dots

Othaman, Zulkafli (2010) AFM, HR-XRD and PL characterization of stacked structures In 0.5Ga0.5As/GaAs quantum dots. Nano, 5 (2). pp. 127-132. ISSN 1793-2920

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Item Type:Article
Subjects:Unspecified
Divisions:Science
ID Code:22812
Deposited By: Kamariah Mohamed Jong
Deposited On:24 Feb 2012 03:48
Last Modified:24 Feb 2012 03:49

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