Othaman, Zulkafli (2010) AFM, HR-XRD and PL characterization of stacked structures In 0.5Ga0.5As/GaAs quantum dots. Nano, 5 (2). pp. 127-132. ISSN 1793-2920
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| Item Type: | Article |
|---|---|
| Subjects: | Unspecified |
| Divisions: | Science |
| ID Code: | 22812 |
| Deposited By: | Kamariah Mohamed Jong |
| Deposited On: | 24 Feb 2012 03:48 |
| Last Modified: | 24 Feb 2012 03:49 |
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