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A new class of easily testable assignment decision diagrams

Paraman, Norlina and Ooi, Chia Yee and Shaameri, Ahmad Zuri and Fujiwara, Hideo (2010) A new class of easily testable assignment decision diagrams. Malaysian Journal of Computer Science, 23 (1). 1 - 17. ISSN 0127-9084

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Official URL: http://ejum.fsktm.um.edu.my/ArticleInformation.asp...

Item Type:Article
Uncontrolled Keywords:Assignment Decision Diagram (ADD), Thru-testable, Design-For-Testability (DFT), Digital testing
Subjects:Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions:Electrical Engineering
ID Code:22805
Deposited By: Kamariah Mohamed Jong
Deposited On:12 Nov 2012 03:22
Last Modified:12 Nov 2012 03:25

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