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Wavelet extension and gray level co-occurrence matrix for texture defect detection and texture retrieval in small dimension images

Agani, Nazori (2005) Wavelet extension and gray level co-occurrence matrix for texture defect detection and texture retrieval in small dimension images. In: 8th International QIR Proceeding (EEE2-SSIP '05), 2005, Indonesia.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:21426
Deposited By: Liza Porijo
Last Modified:19 Jan 2012 08:26

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