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Simulation of nanoscale CMOS device fabrication and their characterization

Hong, Teoh Chin (2005) Simulation of nanoscale CMOS device fabrication and their characterization. In: Annual Fundamental Science Seminar 2005, 2005, UTM, Skudai, Johor.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:21409
Deposited By: Liza Porijo
Last Modified:19 Jan 2012 08:26

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