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Electrical capacitance tomography using universal seriel bus technology

Zhen Cong, Tee (2004) Electrical capacitance tomography using universal seriel bus technology. In: 3rd International Symposium on Process Tomography, Lodz Univ. Poland, 9-10 Sept. 2004, 2004, n/a.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:20449
Deposited By: Liza Porijo
Last Modified:28 Dec 2011 15:54

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