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Texture analysis and classification using wavelet extension and gray level co-occurrence matrix for defect detection in small dimension images

Agani, Nazori (2004) Texture analysis and classification using wavelet extension and gray level co-occurrence matrix for defect detection in small dimension images. In: International Conference on Control, Automation and Systems, 2004, n/a.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:20427
Deposited By: Liza Porijo
Last Modified:28 Dec 2011 15:54

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