Agani, Nazori (2004) Texture analysis and classification using wavelet extension and gray level co-occurrence matrix for defect detection in small dimension images. In: International Conference on Control, Automation and Systems, 2004, n/a.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 20427 |
| Deposited By: | Liza Porijo |
| Last Modified: | 28 Dec 2011 15:54 |
Repository Staff Only: item control page
