Nagarajan, R. (2004) IC chip marking inspection using neural network. In: International Conference On Intelligent Knowledge System IKS-2004, Int. Intelligent Knowledge System Society, Troy,Turkey, 2004, n/a.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 20424 |
| Deposited By: | Liza Porijo |
| Last Modified: | 28 Dec 2011 15:54 |
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