Universiti Teknologi Malaysia Institutional Repository

IC chip marking inspection using neural network

Nagarajan, R. (2004) IC chip marking inspection using neural network. In: International Conference On Intelligent Knowledge System IKS-2004, Int. Intelligent Knowledge System Society, Troy,Turkey, 2004, n/a.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:20424
Deposited By: Liza Porijo
Last Modified:28 Dec 2011 15:54

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