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Excess scilicon concentration dependence of the structural and optical characteristics of silicon nanocrystals embedded in silicon oxide matrix

Wahab, Yussof (2008) Excess scilicon concentration dependence of the structural and optical characteristics of silicon nanocrystals embedded in silicon oxide matrix. In: 2nd International Conference on Advanced Nano Materials, 2008, Aveiro, Portugal.

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Item Type:Conference or Workshop Item (Paper)
Subjects:Q Science
Divisions:?? FS ??
ID Code:19670
Deposited By: Liza Porijo
Last Modified:13 Dec 2011 07:50

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