Wahab, Yussof (2008) Excess scilicon concentration dependence of the structural and optical characteristics of silicon nanocrystals embedded in silicon oxide matrix. In: 2nd International Conference on Advanced Nano Materials, 2008, Aveiro, Portugal.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Q Science |
| Divisions: | ?? FS ?? |
| ID Code: | 19670 |
| Deposited By: | Liza Porijo |
| Last Modified: | 13 Dec 2011 07:50 |
Repository Staff Only: item control page
