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A study on signature analyzer for design for test (DFT)

A'ain, Abu Khari and Lim, C. T. and Kok, Hong Ng and Sheng, Kwang Ng and Liew, Eng Yew (2004) A study on signature analyzer for design for test (DFT). In: Proceedings 2004 IEEE International Conference on Semiconductor Electronics. IEEE, USA, pp. 138-142. ISBN 0-7803-8658-2

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Abstract

This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.

Item Type:Book Section
Additional Information:ISBN: 0-7803-8658-2 IEEE International Conference on Semiconductor Electronics, 07-09 Dec 2004, Kuala Lumpur, MALAYSIA
Uncontrolled Keywords:LFSR, PRBS, BIST, ATPG
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:1888
Deposited By: Dr Zaharuddin Mohamed
Deposited On:16 Mar 2007 02:27
Last Modified:03 Mar 2011 06:47

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