Ibrahim, Muhammad Faisal (2009) Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
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| Item Type: | Thesis (Masters) |
|---|---|
| Additional Information: | Supervisor : Prof. Dr. Abu Khari A'ain; Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009 |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 18227 |
| Deposited By: | Kamariah Mohamed Jong |
| Last Modified: | 18 Nov 2011 04:32 |
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