Parman, Norlina and Ooi, C. Y. and Sha'ameri, Ahmad Zuri and Fujiwara, H. (2008) A new class of easily testable assignment decision diagrams. In: 9th International Workshop on RTL and High Level Testing, 2008, University of Sapporo.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 16866 |
| Deposited By: | Liza Porijo |
| Deposited On: | 31 Oct 2011 05:50 |
| Last Modified: | 31 Oct 2011 05:50 |
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