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A new class of easily testable assignment decision diagrams

Parman, Norlina and Ooi, C. Y. and Sha'ameri, Ahmad Zuri and Fujiwara, H. (2008) A new class of easily testable assignment decision diagrams. In: 9th International Workshop on RTL and High Level Testing, 2008, University of Sapporo.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:16866
Deposited By: Liza Porijo
Deposited On:31 Oct 2011 05:50
Last Modified:31 Oct 2011 05:50

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