Houng, Yau Wei and Ismail, Razali (2009) Analytical model for nanoscale strained-Si MOSFETs. In: The 25th Regional Conference on Solid State Science and Technology (RCSSST 2009). , 2009, Bayview Beach Resort, Pulau Pinang.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 14822 |
| Deposited By: | Liza Porijo |
| Deposited On: | 14 Sep 2011 04:39 |
| Last Modified: | 14 Sep 2011 04:39 |
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