Universiti Teknologi Malaysia Institutional Repository

Analytical model for nanoscale strained-Si MOSFETs

Houng, Yau Wei and Ismail, Razali (2009) Analytical model for nanoscale strained-Si MOSFETs. In: The 25th Regional Conference on Solid State Science and Technology (RCSSST 2009). , 2009, Bayview Beach Resort, Pulau Pinang.

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Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:14822
Deposited By: Liza Porijo
Deposited On:14 Sep 2011 04:39
Last Modified:14 Sep 2011 04:39

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