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Residual stress analysis using raman spectra on polycrystalline diamond coated on WC deposited by microwave plasma assisted chemical vapor deposition

Purniawan, A. and Hamzah, E. and Toff, M. R. M. (2007) Residual stress analysis using raman spectra on polycrystalline diamond coated on WC deposited by microwave plasma assisted chemical vapor deposition. In: 1st International Conference on Sustainable Materials 2007, 2007, Parkroyal, Penang.

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Abstract

Raman spectra is a spectroscopic technique used to observe vibrational, rotational, and other low-frequency modes in a system. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified.

Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:residual stress, raman spectra, polycrystalline diamond, microwave plasma
Subjects:T Technology > TJ Mechanical engineering and machinery
Divisions:Mechanical Engineering
ID Code:14392
Deposited By: Mrs Liza Porijo
Deposited On:24 Aug 2011 07:14
Last Modified:17 Sep 2017 04:37

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