Purniawan, A. and Hamzah, E. and Toff, M. R. M. (2007) Residual stress analysis using raman spectra on polycrystalline diamond coated on WC deposited by microwave plasma assisted chemical vapor deposition. In: 1st International Conference on Sustainable Materials 2007, 2007, Parkroyal, Penang.
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Abstract
Raman spectra is a spectroscopic technique used to observe vibrational, rotational, and other low-frequency modes in a system. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | residual stress, raman spectra, polycrystalline diamond, microwave plasma |
| Subjects: | T Technology > TJ Mechanical engineering and machinery |
| Divisions: | Mechanical Engineering |
| ID Code: | 14392 |
| Deposited By: | Liza Porijo |
| Deposited On: | 24 Aug 2011 07:14 |
| Last Modified: | 17 Sep 2017 04:37 |
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