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Off-state leakage current variations in MOSFET mismatch modeling for circuit simulations

Ismail, Muhamad Amri and Md. Nasir, Iskhandar and Ismail, Razali (2007) Off-state leakage current variations in MOSFET mismatch modeling for circuit simulations. In: IEEE Regional Symposium on Microelectronics (RSM2007), 2007, Penang.

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Abstract

MOSFET is a type of field-effect transistor (FET). It has an insulated gate, whose voltage determines the conductivity of the device. This ability to change conductivity with the amount of applied voltage can be used for amplifying or switching electronic signals.

Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:circuit, leakage current variations
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:14253
Deposited By: Mrs Liza Porijo
Deposited On:23 Aug 2011 05:52
Last Modified:03 Aug 2017 01:12

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