Ismail, Muhamad Amri and Md. Nasir, Iskhandar and Ismail, Razali (2007) Off-state leakage current variations in MOSFET mismatch modeling for circuit simulations. In: IEEE Regional Symposium on Microelectronics (RSM2007), 2007, Penang.
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Abstract
MOSFET is a type of field-effect transistor (FET). It has an insulated gate, whose voltage determines the conductivity of the device. This ability to change conductivity with the amount of applied voltage can be used for amplifying or switching electronic signals.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | circuit, leakage current variations |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 14253 |
| Deposited By: | Liza Porijo |
| Deposited On: | 23 Aug 2011 05:52 |
| Last Modified: | 03 Aug 2017 01:12 |
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