Universiti Teknologi Malaysia Institutional Repository

Modelling of defects within high temperature wall by means of infrared thermography

Syed Abu Bakar, Syed Abdul Rahman (2007) Modelling of defects within high temperature wall by means of infrared thermography. In: Proceedings : International Conference on Risk Technology and Management (RISKtech 2007), 2007, Bandung.

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Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:infrared thermography, high temperature
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:14226
Deposited By: Liza Porijo
Deposited On:22 Aug 2011 01:23
Last Modified:28 Nov 2012 04:11

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