Syed Abu Bakar, Syed Abdul Rahman (2007) Modelling of defects within high temperature wall by means of infrared thermography. In: Proceedings : International Conference on Risk Technology and Management (RISKtech 2007), 2007, Bandung.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | infrared thermography, high temperature |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 14226 |
| Deposited By: | Liza Porijo |
| Deposited On: | 22 Aug 2011 01:23 |
| Last Modified: | 28 Nov 2012 04:11 |
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