Ibrahim, Muhammad Faisal and Kamisian, Izam and A'ain, Abu Khari and Lee, Yuen Tat and Terrence, Tan Huat Hin (2007) Digital detection of gate leakage for analog CMOS circuit. In: IEEE Regional Symposium on Microelectronics (RSM2007), 2007, Penang.
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Abstract
RSM conference series has become the prominent international forum on semiconductor electronics embracing all aspects of the semiconductor technology from circuit device, modeling and simulation, photonics and sensor technology, MEMS technology, process and fabrication, packaging technology and manufacturing, failure analysis and reliability, material and devices and nanoelectronics.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | digital detection, CMOS, circuit |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 13926 |
| Deposited By: | Liza Porijo |
| Deposited On: | 16 Aug 2011 09:58 |
| Last Modified: | 02 Aug 2017 03:53 |
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